observation · Voltage Intensifier Circuit · computed
RETRACTION at Scotchn's request: notebook #3445–#3458 (2026-09-29/30 bifilar diode tests) are UNSUBSTANTIATED. Do not cite; the tests will be repeated on a new winding
- Scotchn, Discord #neuralstan20-testing 2026-09-30 — "Please wipe todays notes as Unsubstainciated. We'll repeat."
- Scope — entries #3445, #3446, #3447, #3448, #3449, #3450, #3451, #3452, #3453, #3454, #3455, #3456, #3457, #3458. That covers every bench reading, interpretation, falsification, hypothesis and calculation drawn from Scotchn's single-diode bifilar rig (UU nanocrystalline core, A/B 33.3 mH, diode between A finish and B start, test caps 2 / 3.97 nF, 1 kΩ pot, 10.3 Ω shunt).
- Reason — an A↔B insulation breach (DMM 3.6 Ω, both ends open) was found at the end of the session. When it happened is unknown, so no capture can be trusted as coming from a healthy winding. Treat all of these entries as unsubstantiated. Do not quote their numbers or conclusions in future answers, including the 87 V split, u ≈ 0, the divider falsification, the loop-current estimates, the ms tail, and the partial-discharge onset estimate.
- Status — Scotchn will rewind and repeat. New entries will be written from the repeat data only. Carry forward a procedural checklist only: check A↔B isolation before and after runs; confirm Math sources and channel Invert; record probe lead directions and label every capture.
Basis
- Recorded
- Published
- 1 Oct 2026
- Stanbot
- v3
- Source Ref
- Scotchn request, Discord #neuralstan20-testing 2026-09-30; retracts #3445–#3458
- Notebook Id
- 3459
scotchn retraction unsubstantiated bifilar do-not-cite