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Electron Bounce Phenomenon

High Voltage Potential of Difference (VO - Vn) (SS' - 617 -RR') is accomplished when
 magnetic flux lines of force (71a xx 71) (Rp) emanating away from closed-loop magnetic pulsing
 core (53) of Figure (190) penetrates Inductance coil-windings (52 - 56 - 62) simultaneously during
 each and every pulse on-time (Tla xxx T1n) as programmable pulse-train (49a xxx 49n T3 - 49a xxx
49n) is adjusted to "Tune - in" to the dielectric property of Water (Re) .... causing mutual inductance
 (μ1) (see equations Eq 28 thru Eq 30) to transform Distributed Capacitance (Cda xxx Cdn) of Figure
 (7-3) of each inductance coils (52 - 56 - 62) into a coherent Voltage Potential (Yo •..• Vn) equaling
 the sum of Voltage Potential (Vp) developed across each Pickup Coils (VpT + Vpl + Vp2) ..•
 producing Dynamic Voltage Potential (600) of Figure (6-3) during repetitive pulsing (49a xxx 49n -
 T3 - 49a xxx 49n) ... setting up and performing pulsating Opposite Electrical Attraction Fore (SS' ~
 617 ~ RR' - T3 - SS' ~ 617 - RR') of Figure (7-4) as to Voltage
 Dynamics (220) of Figure (3-29)

... triggering Hydrogen Fracturing Process (90) of Figure (5~ 5) as
 to (100) of Figure (4-8) ... instantly releasing thermal explosive energy (gtnt) (16) from Water (85)
 on demand, as illustrated in Taper Resonant Cavity (590) of Figure (6-2) as to (70) of Figure (4-5).

The resultant Dynamic Voltage Potential of Difference (opposite electrical attraction force) (SS' -
 617 •... RR') is in balance phase of equal electrical intensity (66 = 67) of opposite polarity (positive
 electrical voltage potential _66 equals negative electrical Voltage potential 66 since the voltage
 Coefficient of Inductance (FL1/FL2), Voltage Coefficient of Capacitance (Cd1/Cd2), and voltage
 Coefficient of Resistance (Rs1/Rs2) across choke coils (L1/L2) are the same values ... allowing,
 Voltage Bounce Phenomenon (700) of Figure (7-9) to be preformed.

Magnetic Field Coupling (71) of Figure (7-9) entering into and passing through Secondary
 Coil-winding (52) of Figure (7-8) causes and produces copper ions (643a xxx 643n) (Positive
 Charged atoms 542a xxx 542n having missing electrons) when moving external electromagnetic
 field strength (71a xxx 7In) is sufficient enough to dislodge electromagnetically charged electrons
(64Ia xxx 64In) from copper atoms making up copper wire material (52). Collectively, the resultant
 positive electrical charged copper ions (642a xxx 642n) added together produces Positive Voltage
 Potential (629) being electrically applied to choke-coil (56); whereas, the "Liberated" negative
 electrical charged electrons (64Ia xxx 64In) added together provides Negative Voltage
RE: VIC Matrix Circuit Memo WFC 426
Stanley A. Meyer 7- 15
Potential (631) to the opposite end of Secondary Wire (52) being electrically connected to choke
 coil (62). Once Secondary Coil-winding (52) is de-energized by the removal (collapsing magnetic
 field during pulse off-time T2 of external Magnetic Field (71), the dislodged electrons (641a xx
 641n) return to positive charged copper ions (642a xx 642n)

... terminating and switching off
 opposite voltage potential (629 - 631) when positive electrical state of the copper atoms changes
 back to net electrical charge of zero. Sustaining and maintaining the resultant induced Voltage
 Potential (Vo - Vn) without "Electron Discharged" (inhibiting electron flow) through Choke Coil
 (62) while, at the same time, inhibiting (preventing) any additional or other electrons from entering
 into Secondary copper wire-zone (52) by way of Choke Coil (56) is herein called "Electron Bounce
 Phenomenon" (EbP), as illustrated in (700) of Figure (7-9).


Electrically Interlinked serially together, Electron Bounce Phenomenon (EbP) , Voltage
 Coefficient of Inductance (Fll/F12), Voltage Coefficient of Capacitance (Cdl/Cd2), Voltage
 Coefficient of Resistance (Rsl/Rs2), and dielectric Coefficient of Water resistance (Re) allows
 Voltage Potential (Vo - Vn) of opposite electrical polarity to perform work (SS' _ 617 _ RR')
 without amp influxing '" thus, not allowing the introduction of electron flow into Hydrogen
 Fracturing Process (90) of Figure (5-5) during Voltage Stimulation (SS' - 617 _ RR')

... causing
 "electron clustering" (641a xxx 641n) to take place within Copper Wire Zone (52) during pulse on-
 time (Tl)

... inhibiting "electron flow" to maintain opposite voltage potential (66/E9 _ 67/E10) across
 Resonant Water Gap (616) during the process of converting water-fuel (85) into instant thermal
 explosive energy (gtnt) ... therefore, producing a physical force-yield (Fy) during gas-ignition (70) of
 Figure (4-5) which is directly related to the liquid volume of water (85) per injection cycle and
 applied Resonant Voltage Intensity (Yo -Vn), as illustrated in (590) of Figure (6-2) as to (90) of
 Figure (5-5).

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Of course, in practical terms of component interaction, a minute amount of amp leakage is
 present and does occur due to Electronic Component Limitations but is negligible as to the overall
 performance of the Hydrogen Fracturing Process (590) of Figure (6-2) when being subjected to
 either one of traveling Electrical Voltage Wave-forms (730a - b - c) of Figure (7-12), see Voltage
 Graph (750) of Figure (7-14) once again.