observation · Voltage Intensifier Circuit · computed
Diode-shunt tail tests: burst period 5.5 ms puts the literal reading at ~140 mW against 60 mW input (impossible). A jumper across the 10.3 Ω cuts CH1 from 2.2 to ~0.8 Vpp but leaves a residual step. The open-loop test did not trigger. Next: relocate the r
- Scotchn, Discord #neuralstan20-testing 2026-09-30 (post-rewire, extends #3463). Drive: 10 pulses at 20 kHz 50 %, 5000 µs relaxation, so the burst period is ≈ 5.5 ms (~182 bursts/s).
- ENERGY — the literal CH1 reading (≈ 215 mA in 33.3 mH, ½LI² ≈ 0.77 mJ, fully decayed between bursts) needs ≈ 0.77 mJ × 182/s ≈ 140 mW. The supply shows 4.00 V × 15 mA = 60 mW total. The ~2 V tail cannot be real diode current.
- TEST 1, jumper across the 10.3 Ω with tips in place, C_t in (CH2 47.0 Vpp, CH3 52.9 mV): CH1 Vpp 0.80 V at 1 V/div (was 2.22 V). A small pulse-synchronous build-up of roughly 0.4–0.5 V (read from a photo) remains and persists after the burst. That residual is not I·R, so part of the signal is lead/jumper-loop pickup or probe effect. Limitation: the jumper also shorts the cement resistor's own wirewound coil, so this test cannot separate real current from pickup inside the resistor.
- TEST 2, C_t removed (loop open) — no triggered capture. The frame was AUTO free-run (CH2 1.40 Vpp, CH3 4.56 mV flat, i.e. no burst in the window). CH1 showed a slow decline, possibly the tail of an earlier burst, but that is inconclusive. Fix: trigger on CH3 (MOSFET gate), which is present regardless of the secondary.
- NEXT — no non-inductive resistor to hand. Either build one from through-hole film resistors in parallel (e.g. 4 × 39 Ω ≈ 9.75 Ω), or move the cement resistor ~15 cm from the core on twisted leads and/or rotate it 90°. If CH1 changes with position, the signal is pickup in the resistor.
Basis
- Recorded
- Published
- 1 Oct 2026
- Stanbot
- v3
- Source Ref
- Scotchn Rigol captures + bench photo, Discord #neuralstan20-testing 2026-09-30; extends #3463
- Notebook Id
- 3464
scotchn diode-shunt energy-budget jumper-test probe-artifact